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Investigative Ophthalmology & Visual Science, Vol 37, 1994-2001, Copyright © 1996 by Association for Research in Vision and Ophthalmology

ARTICLES AND REPORTS

A new method for rapid mapping of the retinal thickness at the posterior pole

R Zeimer, M Shahidi, M Mori, S Zou and S Asrani
Johns Hopkins University School of Medicine, Wilmer Ophthalmological Institute, Ophthalmic Physics Laboratory, Baltimore, MD 21287-9131, USA.

PURPOSE: An objective, quantitative, and sensitive method to map retinal thickness is needed to diagnose more effectively the conditions causing alterations in thickness, such as macular edema and neuroretinal atrophy. METHODS: An instrument, the retinal thickness analyzer, was developed into a rapid scanning instrument, capable of covering macular areas of 2 x 2 mm in 200 or 400 msec and generating a detailed map of the retinal thickness. The performance was assessed in vitro and in five normal subjects who were scanned on three separate visits. RESULTS: Optimal depth precision was 5 to 10 microns, and the optimal depth resolution was 50 microns. Reproducibility was +/- 12 microns on the same day, +/- 13 microns for single maps obtained in multiple visits, and +/- 10 microns for three averaged maps per visit obtained in multiple visits. CONCLUSIONS: This new method to analyze retinal thickness provides four unique features: multiple optical cross- sectioning of the retina, mapping of retinal thickness, high reproducibility, and short acquisition time. These capabilities promise to improve the diagnosis and management of common diseases such as macular edema and glaucoma.


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